Optoelectronic characterization Laboratory (234)
NEPHOS’ Optoelectronic characterization Laboratory (234) is mainly dedicated to the optical and electrical characterization of Nanostructured porous Alumina for sensing applications, thin films and photovoltaic cells. The equipment infrastructure in this lab includes:
- ABETsun2000 Solar Simulator
- Lasing IPCE-DC
- PerkinElmerL-950 UV/VIS/NIR spectrometer
- VERTEX-70 BRUKER FTIR spectrometer
- MTB fluorometry spectrometer
- Ivium-n-Stat Potentiostat
- Keithley 2182A Nanovoltmeter with 4-tips station
- Keithley 2400 sourcemeter for current-voltage under illumination
- Keithley 2611A Sourcemeter for dark current-voltage
- MPPt chamber station with peltier module for temperature control and humidity sensors
- Biolin Sci Contact Angle Microscope
- Hewlett-Packard 4145B Semiconductor Parameter Analizer
- Hewlett-Packard 4280A C-Meter/C-V plotter
- Agilent Technologies B1500A Semiconductor Device Analyzer
- Optical bench
